Fringe Pattern Analysis for Optical Metrology - Servin, Manuel a Quiroga, J. Antonio a Padilla,

Značka: Wiley-VCH Verlag GmbH
Obchod: Bookshop.cz
Parametry: manufacturer: wiley-vch verlag gmbh, categorytext: optical physics
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Fringe Pattern Analysis for Optical Metrology - Servin, Manuel a Quiroga, J. Antonio a Padilla, Moises
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